Перегляд за автором "Prudnikov, A.M."

Сортувати за: Порядок: Результатів:

  • Shalaev, R.V.; Ulyanov, A.N.; Prudnikov, A.M.; Varyukhin, V.N. (Functional Materials, 2010)
  • Shalaev, R.V.; Varyukhin, V.N.; Prudnikov, A.M.; Linnik, A.I.; Zhikharev, I.V.; Belousov, N.N.; Raspornya, D.V.; Ulyanov, A.N. (Functional Materials, 2008)
    The influence of electromagnetic radiation and oxygen impurity in the growth atmosphere on the growth processes of nanostructured carbon nitride CNx films has been studied. The oxygen impurity in the gas mixture and an UV ...
  • Shalaev, R.V.; Varyukhin, V.N.; Prudnikov, A.M. (Functional Materials, 2004)
    Study results on effect of a low power (up to 1 W/cm²) UV and visible radiation on the structure and properties of diamond-like carbon nitride (α-C:N) films during their growth have been presented. The UV irradiation of ...
  • Shalayev, R.V.; Prudnikov, A.M.; Kutrovskaya, S.V.; Varyukhin, V.N.; Linnik, A.I.; Arakelian, S.M. (Functional Materials, 2014)
    All range of nanostructured films of nickel nitrides is synthesized by the method of magnetron sputtering (from the phase of Ni and up to the phase of Ni₂N) and was investigated the change in the magnetic properties. We ...
  • Pashchenko, V.P.; Prudnikov, A.M.; Varyukhin, V.N.; Kisel, N.G.; Bogachova, G.N.; Ishchuk, V.M. (Functional Materials, 2004)
    X-ray structure examination and spectroscopy, as well as hydrostatic method and fluorescence have been used to investigate single crystals of fianites differing in colors, doped with yttrium and rare earth ions. The crystal ...
  • Varyukhin, V.N.; Prudnikov, A.M.; Linnik, A.I.; Olitsky, L.N.; Burkhovetsky, V.V. (Functional Materials, 2010)
  • Kara-Murza, S.V.; Belyaev, B.V.; Gritskih, V.A.; Zhikharev, I.V.; Kortchikova, N.V.; Naumenko, D.A.; Prudnikov, A.M. (Functional Materials, 2007)
    A complex technique has been proposed for optical investigations of nanostructured diamond-like a—C:N films. To determine the thickness d, refractive index no and extinction coefficient n₀, the refraction ellipsometry at ...